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Dresden 2017 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 17: Scanning Probe Techniques: Method Development II

Montag, 20. März 2017, 15:45–18:00, TRE Phy

15:45 O 17.1 Imaging adatoms, rest atoms and defects on Si(111)-7x7 with a CO terminated metal tip — •Daniel Meuer and Franz Josef Giessibl
16:00 O 17.2 Measurement of Nano Particle Adhesion by Atomic Force Microscopy — •Daniel Geiger, Irina Schrezenmeier, Matthias Roos, Tobias Neckernuss, Michael Lehn, and Othmar Marti
16:15 O 17.3 Controlled Nanometer Layer Ablation by Diamond AFM tips in a hybrid SEM/AFM — •Frank Hitzel and Jason Kilpatrick
16:30 O 17.4 Atomic Force Microscopy with stiff qPlus sensors in liquid environments — •Korbinian Pürckhauer, Alfred J. Weymouth, and Franz J. Giessibl
16:45 O 17.5 Imaging successive intermediate states of the on-surface Ullmann reaction — •Daniel Ebeling, Sören Zint, Tobias Schlöder, Sebastian Ahles, Doreen Mollenhauer, Hermann A. Wegner, and Andre Schirmeisen
17:00 O 17.6 AFM investigation on CaF2(111) with atomically characterized tips — •Alexander Liebig, Angelo Peronio, Daniel Meuer, Alfred J. Weymouth, and Franz J. Giessibl
17:15 O 17.7 HR-LC-AFM for detection of current paths on oxides with atomic resolution — •Christian Rodenbücher, Gustav Bihlmayer, Marcin Wojtyniak, Wolfgang Speier, and Kristof Szot
17:30 O 17.8 Scanning tunneling microscopy and potentiometry using a cooled JFET electrometer — •Paul Graf, Meike Flebbe, Christian A. Bobisch, Hermann Nienhaus, and Rolf Möller
17:45 O 17.9 Imaging and quantification of work function variations on a nanostructured surface with scanning quantum dot microscopy — •Christian Wagner, Matthew F. B. Green, Philipp Leinen, Michael Maiworm, Taner Esat, Rolf Findeisen, Ruslan Temirov, and F. Stefan Tautz
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