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Dresden 2017 – scientific programme

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O: Fachverband Oberflächenphysik

O 32: Focus Session: Charge Transport at Surfaces and Nanostructures with Multi-probe Techniques I

Tuesday, March 21, 2017, 10:30–13:00, WIL C307

10:30 O 32.1 Invited Talk: Electrical detection of spin-polarized transport on topological insulator via four-probe spectroscopy — •An-Ping Li, Saban Hus, Corentin Durand, Xiaoguang Zhang, Giang Nguyen, and Yong Chen
11:00 O 32.2 Multi-tip STM analysis of freestanding GaAs-NWs in dependence on surface conditioning — •Andreas Nägelein, Matthias Steidl, Peter Kleinschmidt, and Thomas Hannappel
11:15 O 32.3 Electrical resistance of individual defects at a topological insulator surface — •Felix Lüpke, Markus Eschbach, Tristan Heider, Martin Lanius, Peter Schüffelgen, Daniel Rosenbach, Nils von den Driesch, Vasily Cherepanov, Gregor Mussler, Lukasz Plucinski, Detlev Grützmacher, Claus M. Schneider, and Bert Voigtländer
11:30 O 32.4 In-situ electro-migration studies on silver(Ag) contacts for nanogap fabrication — •Atasi Chatterjee, Ejvind Olsen, Frederik Edler, Torsten Heidenblut, Christoph Tegenkamp, and Herbert Pfnür
11:45 O 32.5 Invited Talk: Probing electron transport with atomic scale precision — •Christian A. Bobisch
12:15 O 32.6 Oxygen adsorption induced tuning of transport in atomic gold chains on vicinal silicion — •Frederik Edler, Ilio Miccoli, Jan P. Stöckmann, Herbert Pfnür, Christian Braun, Simone Sanna, Wolf G. Schmidt, and Christoph Tegenkamp
12:30 O 32.7 Interface Conductivity of Tellurium on Si(111) Investigated by in situ Charge Transport Measurements with a Multi-Tip STMFelix Lüpke, •Sven Just, Martin Lanius, Gustav Bihlmayer, Jiri Dolezal, Martina Luysberg, Elmar Neumann, Vasily Cherepanov, Ivan Ostadal, Gregor Mussler, Detlev Grützmacher, and Bert Voigtländer
12:45 O 32.8 Separating 2D and 3D resistivities using a modified 4-probe methodSnorre Kjeldby, Simon Cooil, and •Justin Wells
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