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AM: Magnetismus
AM 1: Magnetische Schichten und Vielfachschichten I
AM 1.1: Invited Talk
Monday, March 17, 1997, 09:30–10:15, F5
Quantitative Magnetic Force Microscopy on Ferromagnetic and Superconducting Materials — •H.J. Hug, B. Stiefel, P.J.A. van Schendel, S. Martin, and H.-J. G"untherodt — Universit"at Basel, Institut f"ur Physik, Klingelbergstr. 82, CH-4056 Basel, Schweiz
Since its invention Magnetic Force Microscopy (MFM) has become a widely used tool to image and modify the domain structure of ferromagnetic materials, to map the field or to test the local response of recording heads and to image and modify vortices in superconductors. However, it has been difficult to extract quantitative information on the lcoal magnetization structure of the sample from MFM data. After a general introduction into MFM image formation, the application of the Magnetic Force Microscope to the Cu/Ni/Cu/Si(001)-system and to the YBa2Cu3O7−x system is discussed. The Cu/Ni/Cu/Si(001) has been well studied by both, new MFM techniques and more conventional measurement techniques sensitive to magnetism and structure. The combination of these techniques and theoretical modeling gives new insight into the complex dependence of the magnetization on film thickness and external field. On the YBa2Cu3O7−x system the combination of low temperature MFM and theoretical modeling using the Ginsburg-Landau theory allows the determination of the local penetration depth from vortex images. Future applications of force microscopy possibly leading to exchange force measurements with atomic resolution will be discussed.