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CP: Chemische Physik

CP 2: Symposium: Benetzung und dünne Filme

CP 2.1: Fachvortrag

Monday, March 22, 1999, 11:15–11:45, Phy

Density profiles of thin liquid films studied by x-ray scattering — •M. Tolan, A.K. Doerr, J.-P. Schlomka, and W. Press — Institut f"ur Experimentelle und Angewandte Physik, Universit"at Kiel, Leibnizstr. 19, D-24118 Kiel

Liquid wetting films occur in many circumstances in our daily life. Hence extensive research has been done in the past on those films. However, since many direct probes such as STM, AFM, or TEM with a resolution of only a few angstroms are not applicable only a few quantitative studies on liquid films exist so far. In this talk it will be shown how density profiles of thin liquid alkane (cyclohexane, n-hexane, and perfluorohexane) films on silicon substrates were determined by specular and diffuse x-ray scattering measurements. On one hand, the solid/liquid interface region is strongly influenced by the confinement of the liquid introduced by the substrate. On the other hand, free capillary waves are detected on the liquid/vapour interface.

This work is supported by the DFG under contract number Pr325/5-2.