Münster 1999 – scientific programme

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DS: Dünne Schichten

DS 16: Charakterisierung mittels SXM-Techniken I

Tuesday, March 23, 1999, 09:30–11:00, PC 7

	09:30	DS 16.1	Invited Talk: Optische Mikroskopie jenseits der Beugungsgrenze: Tatsachen, Trends und Träume — •Paul Fumagalli
	10:15	DS 16.2	Invited Talk: Thermal nano-phase change of an Antimony thin film and the application for optical near-field data storage — •J. Tominaga and T Fukaya