Münster 1999 – wissenschaftliches Programm
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DS: Dünne Schichten
DS 33: Postersitzung
DS 33.41: Poster
Dienstag, 23. März 1999, 09:30–17:30, Aula
HRTEM and resistivity investigations on structure-property correlations in PLD-grown epitaxial SrRuO3 films on SrTiO3(001) — •N.D. Zakharov1, K.M. Satyalakshmi1,2, D. Hesse1, and G. Koren2 — 1Max-Planck-Institut für Mikrostrukturphysik Halle — 2Technion - Israel Institute of Technology, Haifa, Israel
Structure and properties of thin conducting epitaxial SrRuO3 films grown by pulsed laser deposition (PLD) on SrTiO3(001) substrates are investigated in detail. Atomic force microscopy (AFM) and high resolution transmission electron microscopy (HRTEM) investigations revealed that the films grow via island formation and growth. Typical film thickness is 20 nm. The film resistivity exhibits metallic behavior with a ferromagnetic transition at 150 K. Films grown at 775 ∘C exhibited the lowest film resistivity of 200 µΩcm, whereas those grown at lower (700 ∘C) and higher (850 ∘C) temperatures showed a much higher resistivity. By AFM and HRTEM investigations, this behavior is correlated with the atomic-scale structure of the films in terms of the crystallographic phase and the kind and density of defects present, like SrO-rich antiphase boundaries and twins located at the boundaries between the islands.