Regensburg 2002 – wissenschaftliches Programm

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SYPF: Struktur und Dynamik in dünnen Polymerfilmen

SYPF 1: Structure and Dynamics in Thin Polymer Films

SYPF 1.1: Hauptvortrag

Donnerstag, 14. März 2002, 08:30–09:10, H37

Using Scattering to Probe Patterning From the Nano to the Micro — •T.P. Russell — Polymer Science and Engineering Department, University of Massachusetts at Amherst, Amherst, MA 01003, USA

Electric fields have been shown to be a very effective means of obtaining alignment in thin polymer films containing domains that are anisotropic in shape. The essential difference between bulk and thin film behavior is the energy required to overcome differences in the interfacial energies of the components. Results indicate that alignment in block copolymers and layered polymers occurs by an amplification of density fluctuations at the interface between these nanoscopic domains. A pressure, developed at the interface, essentially pulls the domains into alignment. This phenomenon is shown to map from the nanoscopic level with copolymers to the microscopic level with polymer bilayers where microscopic domain alignment is found. X-ray and neutron scattering and reflectivity have prove to be indispensable tools for the characterization of the alignment mechanism and ordering. These aligned morphologies provide a unique means of producing arrays of nanoscopic structures that are finding use in a wide range of applications ranging from biological to magnetic storage devices.

This work was done in collaboration with: T.Thurn-Albrecht (Universitaet Freiburg), U. Steiner, E.Schaeffer (University of Groningen), T.Kerle, H.C.Kim, J.DeRouchey, A.Lin, A.Leach, J.Goldbach and M.Tuominen (University of Massachusetts Amherst)

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