Regensburg 2004 – wissenschaftliches Programm
CPP 2.1: Vortrag
Montag, 8. März 2004, 11:00–11:15, H 37
Scanning thermal microscopy for investigation of mechanical properties of thin polymer films — •Martin Hinz1, Andreas Kleiner1, Sabine Hild1, Othmar Marti1, Urs Dürig2, Bernd Gotsmann2, Ute Drechsler2, Peter Vettiger2, and Tom R. Albrecht2 — 1Department of Experimental Physics, University of Ulm, D-89069 Ulm — 2IBM Research Division, Zurich Research Laboratory, CH-8803 Rüschklikon
Mechanical properties of bulk polymers have been investigated by different methods over decades, but in recent times the mechanics of thin polymer films became of large interest. Scanning Force Microscopy (SFM) provides a possibility to probe mechanical properties on nanometer scale. In this study Scanning thermal microscopy (SThM) is applied to investigate the temperature dependent indentation process of a pulse heated SFM-tip (heating pulse less than 100 Mikroseconds) with tip temperatures between 300 and 500∘C on Polymethylmethacrylate films of 35 nm thickness which were produced by spin-coating on Silicon substrates. Additional application of an electro-static force acting between tip and sample enhances the indentation process. Additionally these experiments are carried out on samples heated on a heating device. The remanent topography is analysed as function of tip and sample temperature, heating pulse duration and electrostatic force.