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Regensburg 2004 – scientific programme

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SYXM: X-RAY Magneto-Optics

SYXM 1: X-Ray Magneto-Optics

SYXM 1.2: Invited Talk

Tuesday, March 9, 2004, 15:00–15:30, H1

Magnetization profiling by resonant magnetic x-ray reflectometry — •G. Schütz, J. Geissler, and E. Goering — Max-Planck Institut für Metallforschung, Stuttgart

The asymmetry ratio of resonant magnetic x-ray reflection shows a strong variation with the angle of incidence. The maximum value of the complex magnetic reflection profile is in the order of the corresponding XMCD signal, from which the main magnetic contribution of the absorptive scattering amplitude can be deduced while the dispersive part is calculated via Kramers Kronig relations. If the correlation of the XMCD effect to the atomic magnetic moment is known, the magnetization depth profile can be deduced by an artificial slicing method utilizing the Parratt algorithm [1]. For hard x-rays (e.g. L2,3 edges for 4f or 5d elements) with scattering vector of less than one degree cross and scalar products can be simplified. The application of this theoretical model is much more complicated for soft x-rays and related to large scattering angles. However, this energy range covers the L2,3 edges of 3d transition elements, which exhibit large asymmetry ratios amounting to 50 % [2]. The potential of this method especially for technical relevant GMR/TMR systems, whose magneto-electric properties can strongly depend on the interphase morphogy, is demonstrated for a Pt/Co/Cu trilayer. For this composition it was possible to determine the variation of the magnetic interface depth profile for each layer reaching an accuracy of about 10 % for Pt and Co with a depth resolution up to 0.1 nm. Even for the Cu component an estimation of the induced magnetic moment at the Co-Cu interface is possible [3].

[1]  J. Geissler et al., Phys. Rev. B 65, 020405 (2001)

[2]  J. Geissler et al., Z. Metallkd. 93, 946 (2002)

[3]  E. Goering et al., in preparation

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