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O: Oberflächenphysik

O 15: Postersitzung (Adsorption an Oberfl
ächen, Epitaxie und Wachstum, Organische Dünnschichten, Oxide und Isolatoren, Rastersondentechniken, Zeitaufgelöste Spektroskopie, Methoden)

O 15.84: Poster

Friday, March 4, 2005, 17:00–20:00, Poster TU D

Advances in nanofocusing with reflective photon sieves — •Jan Bartussek, Jens Buck, Matthias Kalläne, Sönke Harm, Kai Rossnagel, and Lutz Kipp — Institut für Experimentelle und Angewandte Physik, Universität Kiel, D-24098 Kiel

Photon sieves are a new type of diffraction optics for focusing synchrotron radiation to submicrometer dimensions. They appear especially promising for future angle and spatially resolved photoemission experiments at the VUV-FEL at HASYLAB, because side lobes in the intensity pattern in the focal plane can be suppressed almost completely by applying smooth window functions. In addition, by separating zero from first order light the background can be reduced significantly. Using a knife edge scanner we measured focal spots for photon sieves optimized for a photon energy of 100 eV. Experiments were carried out at beamline BW3 at HASYLAB. The results are discussed in the context of numerical simulations. Work is supported by BMBF proj. no. 05 KS1 FK1.