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Dresden 2006 – scientific programme

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DS: Dünne Schichten

DS 4: Thin film analysis II

Monday, March 27, 2006, 11:15–12:45, GER 38

11:15 DS 4.1 Determination of Mn valency using ELNES in the (S)TEM — •Thomas Riedl, Thomas Gemming, and Klaus Wetzig
11:30 DS 4.2 Epitaxial anatase (012) and (001) films grown on (110) and (100) SrTiO3 — •Andriy Lotnyk, Stephan Senz, and Dietrich Hesse
11:45 DS 4.3 Aberration correction used for interface characterisation with atomic resolution — •Meiken Falke, Andrew Bleloch, Uwe Falke, Gunter Beddies, and Steffen Teichert
12:00 DS 4.4 Texture Characterization of Pyrolytic Carbon Layers: A Quantitative Study by Polarized Light Microscopy and Selected Area Electron Diffraction — •Andreas Pfrang, David Bach, Dagmar Gerthsen, and Thomas Schimmel
12:15 DS 4.5 Local density profiles in thin films and multilayers from diffuse x-ray and neutron scattering — •Markus Rauscher, Harald Reichert, Simon Engemann, and Helmut Dosch
12:30 DS 4.6 Coherence experiments with white synchrotron radiation — •Gudrun Gleber, Tobias Panzner, and Ullrich Pietsch
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