DPG Phi
Verhandlungen
Verhandlungen
DPG

Regensburg 2007 – scientific programme

Parts | Days | Selection | Search | Downloads | Help

MA: Fachverband Magnetismus

MA 15: Poster:ThinFilms(1-33),Transp.(34-49),ExchBias(50-56),
Spindynamics(57-70),Micro-nanostr.Mat.(71-82),
Particles/Clust.(83-88), Mag.Imag./Surface(89-96),
Spinelectronics(97-109), Theory/Micromag.(110-116),
Spinstruct/Phasetr.(117-128),Magn.Mat.(129-139),
Aniso.+Measuring(140-145), MolMag.(146-152),
MSMA(153-156)

MA 15.6: Poster

Tuesday, March 27, 2007, 15:00–19:00, Poster A

Growth of La1−xCaxMnO3 and BaTiO3 thin films and multilayers using PLD with in-situ RHEED — •Heiko Fasold, Alexander Hirsch, Ralf Koppert, Frank Ludwig, and Meinhard Schilling — Institut für Elektrische Messtechnik und Grundlagen der Elektrotechnik, TU Braunschweig,Hans-Sommer-Straße 66, D-38106 Braunschweig, Germany

Multiferroics, materials with ferroelectric and ferromagnetic properties, are interesting for both basic research and applications. One way to design multiferroic materials for new sensor applications is to grow superlattices with alternating ferromagnetic and ferroelectric layers.

Using Pulsed Laser Deposition (PLD) La1−xCaxMnO3 (LCMO) and BaTiO3 (BTO) thin films and multilayers were grown. The growth of the films is monitored by in-situ reflection high energy electron diffraction (RHEED). The characterization is supplemented by X-ray diffraction (XRD) and atomic force microscopy (AFM).

The LCMO films were grown with different calcium concentrations. Optimal growth conditions lead to high quality oriented crystalline magnetic films with a rms roughness less than 1nm for layer thicknesses up to 500 nm. Both LCMO and BTO were deposited on single terminated atomically flat SrTiO3 (100) and NdGaO3 (110) substrates. The influence of substrate and its surface quality on the growth conditions and properties of the thin films is analyzed. Superlattices with alternating LCMO and BTO layers were grown. RHEED intensity oscillations are used to determine and control the thickness of the multilayers.

100% | Mobile Layout | Deutsche Version | Contact/Imprint/Privacy
DPG-Physik > DPG-Verhandlungen > 2007 > Regensburg