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MM: Fachverband Metall- und Materialphysik
MM 21: HV Nierlich
Wednesday, March 28, 2007, 14:00–14:30, H16
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14:00 | MM 21.1 | Invited Talk: XRD residual stress analysis: one of the few advanced physical measuring techniques that have established themselves for routine application in industry — •Wolfgang Nierlich and Jürgen Gegner |