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O: Fachverband Oberflächenphysik

O 15: Methods: Scanning Probe Techniques II

O 15.3: Talk

Monday, March 26, 2007, 14:45–15:00, H41

Frequency Modulation Dynamic Force Microscopy applying amplitudes in the low nm range: Questions, findings — •Georg Hermann Simon, Markus Heyde, Hans-Peter Rust, and Hans-Joachim Freund — Fritz-Haber-Institute of the Max-Planck-Society, Faradayweg 4-6, D-14195 Berlin, Germany

Atomically resolved images of various surfaces of semiconductors [1], insulators [2] and metals [3] are given in the literature. Most of them being the result of large amplitude measurements with soft cantilevers while some have been obtained with stiff quartz tuning forks [4, 5] and small amplitudes (few nm or less). Such high resolution with small amplitudes, despite the success, raises questions concerning sensitivity, measured forces and signal to noise ratio.

Here, we have started a detailed analysis of frequency shift-distance curves obtained by our low temperature dynamic force microscope operated with a quartz tuning fork sensor in the small amplitude regime. The experimental data is compared to a simple theoretical model and results from literature. From the findings further conclusions for sensor improvement can be drawn.

[1] F. J. Giessibl, Science 267, 68 (1995)

[2] M. Reichling, C. Barth, Phys. Rev. Lett. 83, 768 (1999)

[3] K. Yokoyama, T. Ochi, Y. Sugawara, S. Morita, Phys. Rev. Lett. 83, 5023(1999)

[4] F. J. Giessibl, Appl. Phys. Lett. 76, 1470 (2000)

[5] M. Heyde, M. Sterrer, H.-P. Rust, H.-J. Freund, Appl. Phys. Lett. 87, 083104 (2005)