Regensburg 2007 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 17: Poster Session I (Nanostructures at Surfaces; Metal Substrates: Epitaxy and Growth; Methods: Scanning Probe Techniques; Phase Transitions)

O 17.62: Poster

Montag, 26. März 2007, 17:30–20:30, Poster C

Calibration of a thermal profiler in a scanning tunneling microscope in terms of measuring the near-field heat transfer — •Andreas Knübel, Uli Wischnath, and Achim Kittel — University of Oldenburg, Institute of Physics, Department of Energy and Semiconductor Research, D-26111 Oldenburg

The fabrication of a novel thermocouple sensor as a thermal profiler has enabled us to set up a very sensible scanning thermal microscope (SThM) based on a scanning tunnelling microscope (STM) under ultrahigh vacuum conditions with high spatial resolution. This provides the possibility to an improved analysis of the frequently discussed near-field heat transfer on a nanometer scale. Because theory already provides a statement for the distance dependence of the heat transfer this quantity has to be determined experimentally for comparison. Therefore, it is essential to characterize the thermal resistance. By means of the thermal resistance of the microscope tip its possible to quantify the heat transfer through the vacuum gap between the thermocouple tip and a cooled planar material surface from the measured temperatures. We developed a specially designed set-up to evaluate the thermal resistance of the thermocouple tip under ultra-high vacuum conditions. Current experimental results are presented.