DPG Phi
Verhandlungen
Verhandlungen
DPG

Dresden 2009 – scientific programme

Parts | Days | Selection | Search | Downloads | Help

DF: Fachverband Dielektrische Festkörper

DF 16: Thin Films and Nanostructures III

DF 16.4: Talk

Thursday, March 26, 2009, 15:50–16:10, WIL B321

Impact of high interface density on ferroelectric and structural properties of PbZr0.2Ti0.8O3 / PbZr0.4Ti0.6O3 epitaxial multilayers — •Ludwig Feigl1, Shijian Zheng2, Balaji I. Birajdar1, Brian J. Rodriguez1, Yinlian Zhu1,2, Marin Alexe1, and Dietrich Hesse11Max Planck Institute of Microstructure Physics, Weinberg 2, D-06120 Halle, Germany — 2Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, 72 Wenhua Road, 110016 Shenyang, China

Multilayers consisting of the two tetragonal compositions PbZr0.2Ti0.8O3 and PbZr0.4Ti0.6O3 were deposited onto a SrRuO3 electrode grown on a vicinal (100) SrTiO3 substrate. It has been shown by extensive structural investigations comprising transmission electron microscopy in conventional and high resolution mode, reciprocal space mapping and piezoresponse force microscopy that with decreasing layer thickness a transition from a-domains confined to individual layers to a-domains propagating through the whole film takes place. This is caused by the formation of a common strain state of all layers which is responsible for the observed enhancement of the electrical properties. These show a maximum in the product of remanent polarization and dielectric constant at a certain density of interfaces. If the interface density becomes too high the lattice distortion accompanying each interface deteriorates the properties of the multilayer structure.

100% | Mobile Layout | Deutsche Version | Contact/Imprint/Privacy
DPG-Physik > DPG-Verhandlungen > 2009 > Dresden