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Dresden 2009 – scientific programme

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DS: Fachverband Dünne Schichten

DS 15: Thin Film Metrology for Electronics, Photonics, and Photovoltaics II

Tuesday, March 24, 2009, 15:15–16:30, GER 38

15:15 DS 15.1 Topical Talk: Investigations of electrophysical properties of thin films with embedded nanoparticles by means of an immitance meterViktoria V. Malyutina-Bronskaya, •Valerii B. Zalesskii, and Tamara R. Leonova
15:45 DS 15.2 Characterization of strained Si films by variable angle spectroscopic ellipsometry and Raman spectroscopy — •Zhijiat Chong, Martin Weisheit, Michael Hecker, and Ehrenfried Zschech
16:00 DS 15.3 Polarization dependent interface properties of ferroelectric Schottky barriers studied by soft X-ray — •Hermann Kohlstedt, Adrian Petraru, Matthias Meiner, Jonathan Denlinger, Jinghua Guo, Wanli Yang, Andreas Scholl, Byron Freelon Freelon, Theo Schneller, Rainer Waser, Pu Yu, and Ramamoorthy Ramesh
16:15 DS 15.4 Piezoelectric phenomena in barium titanate thin films observed in nanoscale using piezoresponse force microscopy — •Grzegorz Wielgoszewski, Teodor Gotszalk, Piotr Firek, Jan Szmidt, and Aleksander Werbowy
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