Dresden 2009 – scientific programme

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DS: Fachverband Dünne Schichten

DS 16: Poster I

DS 16.19: Poster

Tuesday, March 24, 2009, 09:30–12:30, P5

Investigation of buried metal-organic interfaces with Photoelectron Spectroscopy (PES) — •Pavo Vrdoljak¹, Achim Schöll¹, Friedrich Reinert¹, and Eberhard Umbach² — ¹Universität Würzburg, Experimentelle Physik II, 97074 Würzburg — ²Forschungszentrum Karlsruhe, 76021 Karlsruhe

Interfaces in electronic devices based on organic semiconductors have a strong in-fluence on the device performance. The layer morphology and the resulting electronic structure at the contact have to be controlled in order to optimize the charge carrier transport. In case of a metal top contact deposited on an organic layer the established metal-organic interface is morphologically rough and the contact properties can be substantially different if compared to model systems like single crystalline or amorphous metal substrates with organic adsorbates. However, the investigation of buried contact interfaces by surface sensitive techniques such as photo electron spectroscopy (PES) and atomic force microscopy (AFM) requires a sophisticated preparation technique to provide access to this region. We present an experimental approach which allows the removal of the metal top-contact in the UHV and subsequent in-situ analysis with surface sensitive spectroscopies. Moreover, we will present PES and AFM results of Ag/PTCDA and of PTCDA on amorphous Ag substrates. In the latter case a comparison of the PES data to single crystalline samples indicates that the interface is mainly built up by Ag(111) and Ag(110) domains.