Dresden 2009 – wissenschaftliches Programm

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MA: Fachverband Magnetismus

MA 14: Poster Ib: Magnetic Materials (1-14); Micro Magnetism/Computational Mag. (15-17); Surface Magnetism (18-22); Spin Structures/Phase Transitions (23-25)

MA 14.14: Poster

Dienstag, 24. März 2009, 10:15–13:00, P1B

Local resolved ferromagnetic resonance measurments — •Sven Stienen, Ralf Meckenstock, Jürgen Lindner, and Michael Farle — Universität Duisburg-Essen, Duisburg, Deutschland

A scanning thermal microscope (SThM) was designed to measure local resolved ferromagnetic resonance (FMR). To realize the required stability for slow thermal scans in combination with high magnetic fields an AFM (XE-70) is used. This guarantees a lateral stability of 10 nm during a 200 mT variation of the field. For this a specially shaped magnet was developed, which emits only a small stray field towards the microscope. A non magnetic tip holder was also developed. Due to the use of the magnet, the conventional XE-70 had to be modified. Using a modulated constant-current source in combination with a lock-in technique, the sensitivity of the thermal measurements could be improved by a factor of 10 compared to an old SThM setup. With the new setup, a lateral resolution of less then 100 nm is achieved. The new setup of the scanning thermal microscope has proven to characterize thermal and magnetic properties of nanostructured systems. The thermal resolution limit of the setup was demonstrated as low as 0,2 mK by a thermal characterizations of single-crystalline silver wire. For the first time a local thermal FMR spectrum was received with a resolution of less then 100 nm on a single Py wire. This spectrum was compared to a conventionally detected FMR signal of whole Py wire array. In addition, a thermal image of a single Py wire was taken during resonance.