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O: Fachverband Oberflächenphysik

O 47: Methods: Scanning probe techniques II

O 47.3: Talk

Thursday, March 26, 2009, 11:00–11:15, SCH A316

Dynamic Force Microscopy with Small Amplitudes at Ambient Conditions — •Elisabeth Köstner and Franz J. Gießibl — Institut für Experimentelle und Angewandte Physik, Universität Regensburg, 93040 Regensburg

Yamada et al. [1] have shown that it is possible to obtain atomic resolution on cleaved mica in water with frequency-modulation force microscopy. These impressive results have been acquired with a very sophisticated setup. This setup enabled them to get a very low deflection noise density, which is decisive for atomic resolution in their measurement scheme.

In our case we tried to image surfaces at ambient conditions with quartz tuning fork based cantilevers. We tried to simplify our setup by using stiff cantilevers (spring constant of some thousand N/m) with small amplitudes (some nanometers) and---most importantly---a higher Q factor. Some first results made in amplitude-modulation force microscopy mode with this setup are presented showing atomic resolution on graphite in air.

[1] T. Fukuma, K. Kobayashi, K. Matsushige, and H. Yamada, Appl. Phys. Lett. 87, 034101 (2005)