Regensburg 2010 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 3: Methods: Scanning probe techniques I

O 3.3: Vortrag

Montag, 22. März 2010, 11:45–12:00, H32

Atomic-resolution force map measurements on single molecules — •Fabian Mohn, Leo Gross, Nikolaj Moll, Peter Liljeroth, and Gerhard Meyer — IBM Research - Zurich, 8803 Rüschlikon, Switzerland

It was recently shown that atomic resolution can be achieved in AFM imaging of individual molecules by a controlled functionalization of the microscope’s tip apex [L. Gross et al., Science 325, 1110 (2009)]. We present measurements that yield further insight into the nature of the contrast mechanism in this atomic-resolution imaging of molecules.

In particular, the distance-dependence of the frequency shift above admolecules was investigated with atomic resolution. The standard technique of 3D force mapping was extended to permit measuring at close tip–sample distances, in the regime of maximal attractive forces. A precise control of the interaction strength during data acquisition is essential to avoid instabilities of the imaged molecules. Our technique enables atomic resolution on both the substrate and the admolecules, simultaneously.