DS 8: Thin Film Characterisation: Structure Analysis and Composition (XRD, TEM, XPS, SIMS, RBS, ...) I
Monday, March 14, 2011, 10:15–11:45, GER 38
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10:15 |
DS 8.1 |
Oberflächennahe Analytik mit Kleinwinkelröntgenstreuung im Labor — •Jörg Wiesmann, Peter Siffalovic, Jozef Keckes und Günther Maier
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10:30 |
DS 8.2 |
BioRef - a versatile time-of-flight reflectometer for soft matter applications at Helmholtz-Zentrum Berlin für Materialien und Energie, Berlin — •Markus Strobl, Roland Steitz, Martin Kreuzer, Reiner Dahint, and Michael Grunze
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10:45 |
DS 8.3 |
Comparison of quantitative X-Ray Fluorescence Spectrometry under normal and grazing incidence condition by means of buried nanolayers — •Rainer Unterumsberger, Beatrix Pollakowski, Matthias Müller, Burkhard Beckhoff, Wolfgang Ensinger, Peter Hoffmann, Tobias Adler, and Andreas Klein
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11:00 |
DS 8.4 |
X-ray Reflectivity and Grazing Incidence X-ray Diffraction — •Markus Meyl, Bogdan Szymański, Arno Ehresmann, and Feliks Stobiecki
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11:15 |
DS 8.5 |
Nucleation Mechanisms In High Energy Ion Beam Induced Dewetting — •Michael Haag, Daniel Garmatter, Redi Ferhati, Sankarakumar Amirthapandian, and Wolfgang Bolse
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11:30 |
DS 8.6 |
Sophisticated analysis of the PDA of thin praseodymia films at temperatures up to 300°C — •Sebastian Gevers, Daniel Bruns, Alessandro Giussani, Thomas Schröder, and Joachim Wollschläger
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