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Dresden 2011 – scientific programme

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HL: Fachverband Halbleiterphysik

HL 87: ZnO: Growth and Defects

Friday, March 18, 2011, 10:15–13:30, POT 51

10:15 HL 87.1 Structural parameters of ZnMgO from first principles and experiment — •Marcel Giar, Thomas Wassner, Bernhard Laumer, Martin Eickhoff, and Christian Heiliger
10:30 HL 87.2 Defect Reduced Growth of Pulsed Laser Deposited ZnO — •Fabian Budack, Marc A. Gluba, Lars-Peter Scheller, and N.H. Nickel
10:45 HL 87.3 Electrochemical deposition of ZnO for Flexible Electronic Devices — •Miriam Schwarz and Veit Wagner
11:00 HL 87.4 Incorporation of dopant atoms into zinc oxide surface layers using ultrashort laser pulses — •Andreas Schneider, Apurba Dev, Kathrin Sebald, and Tobias Voß
11:15 HL 87.5 Dominant Laplace DLTS peaks E280 and E290 in melt-grown ZnO — •Leopold Scheffler, Vladimir Kolkovsky, and Jörg Weber
11:30 HL 87.6 (contribution withdrawn) Metastable state of the VZnH2 defect in ZnO — •Dirk Bastin, Edward Lavrov, and Jörg Weber
12:00 HL 87.7 Ion-beam Induced Luminescence in n-type Zinc Oxide — •Ronald Stübner, Matthias Allardt, Daniel Severin, Markus Bender, and Jörg Weber
12:15 HL 87.8 Zn1−xCdxO thin films and heterostructures grown by pulsed laser deposition — •Martin Lange, Christof P. Dietrich, Holger von Wenckstern, Michael Lorenz, and Marius Grundmann
12:30 HL 87.9 Strain-related defects in MgxZn1−xO thin films — •Florian Schmidt, Holger von Wenckstern, and Marius Grundmann
12:45 HL 87.10 Strain distribution in ZnO microwires — •Christof P. Dietrich, Martin Lange, Fabian J. Klüpfel, Rüdiger Schmidt-Grund, Holger von Wenckstern, and Marius Grundmann
13:00 HL 87.11 On the T2 deep level in zinc oxide thin films — •Matthias Schmidt, Robert Karsthof, Florian Schmidt, Holger von Wenckstern, Martin Ellguth, Rainer Pickenhain, Marius Grundmann, and Gerhard Brauer
13:15 HL 87.12 Low temperature CVD-synthesis of nitrogen doped ZnO thin films — •Sebastian Eisermann, Stefan Lautenschlaeger, Michael N. Hofmann, Andreas Laufer, Melanie Pinnisch, Christian Reindl, Julian Benz, Peter J. Klar, and Bruno K. Meyer
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