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MA: Fachverband Magnetismus

MA 52: Magnetic Thin Films III

MA 52.3: Vortrag

Donnerstag, 17. März 2011, 11:30–11:45, HSZ 403

X-ray diffraction studies of Mn_3−xGa Heusler thin films — •Patrick Thomas, Daniel Ebke, Manuel Glas, and Günter Reiss — Thin Films and Physics of Nanostructures, Physics Department, Bielefeld University, Germany

Perpendicular magnetized thin films have attracted a lot of attention, because of the possible higher storage densities in comparison to common magnetic memory devices. In contrast to multilayered thin films like Co/Pd for inducing a perpendicular anisotropy, we have investigated the crystal structure of the tetragonal distorted Heusler lattice Mn_3−xGa. In this work we will discuss the crystal growth properties of the Heusler thin films for different substrates and buffer layers as a function of deposition temperature and film thickness.