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Dresden 2011 – scientific programme

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MM: Fachverband Metall- und Materialphysik

MM 29: Topical Session TEM VIII

Wednesday, March 16, 2011, 15:45–17:00, IFW B

15:45 MM 29.1 Quantitative TEM-EDX analysis of compositional inhomogeneities in CIGS absorbers — •Isabel Knoke, Benito Vieweg, Stefan Jost, Jörg Palm, and Erdmann Spiecker
16:00 MM 29.2 Determination of Nitrogen Concentration in Dilute GaNAs by STEM HAADF Z-Contrast Imaging — •Tim Grieb, Knut Müller, Oleg Rubel, Rafael Fritz, Marco Schowalter, Kerstin Volz, and Andreas Rosenauer
16:15 MM 29.3 Quantitative local profile analysis of nanomaterials based on TEM diffraction — •Christoph Gammer, Clemens Mangler, Hans-Peter Karnthaler, and Christian Rentenberger
16:30 MM 29.4 Diffraction spots off the diffraction rings in severely deformed bulk nanocrystalline FeAl — •Anna Findeisen, Christoph Gammer, Christian Rentenberger, and Hans-Peter Karnthaler
16:45 MM 29.5 TEM Studies on Etch Pit Formation during the Nucleation of 3C-SiC on Si(001) — •Julian Müller, Philip Hens, Peter Wellmann, and Erdmann Spiecker
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