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DPG

Dresden 2011 – scientific programme

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O: Fachverband Oberflächenphysik

O 35: Poster Session I (Scanning probe methods)

O 35.20: Poster

Tuesday, March 15, 2011, 18:30–22:00, P3

Scanning Force Microscopy up to the Millimeter ScaleAlexander Förste1,2, •Markus Moosmann1,2, Manuel Rothenberger1,2, Tobias Meier1,2, Roland Gröger1,2, Matthias Barczewski1,2, Stefan Walheim1,2, and Thomas Schimmel1,21Institute of Nanotechnology (INT), Karlsruhe Institute of Technology (KIT) Campus North — 2Institute of Applied Physics and DFG-Center for Functional Nanostructures (CFN), Karlsruhe Institute of Technology (KIT) Campus South

Using a novel Scanning Force Microscope (SFM) allowing the so far largest scan range achieved (800 µm x 800 µm), surface topography and properties as well as surface processes were studied in a wide range of length scales from the nanometer scale to the sub-millimeter scale. The resolution of single monolayer steps is demonstrated even at ultra-large scan ranges. As sample systems we investigated 1) structured ultra-thin films made from self-assembled monolayers, 2) thin self-organized polymer blend films structured via phase separation and 3) strongly corrugated surfaces produced by embossing or UV lithography.

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