Berlin 2012 – wissenschaftliches Programm
MA 19: Joint Session "Multiferroics III - Strain / New Routes towards Multiferroicity" (jointly with DF, DS, KR, TT)
MA 19.1: Vortrag
Dienstag, 27. März 2012, 09:30–09:45, EB 301
Substrate influence on the strain in epitaxially grown BiCrO3 thin films investigated using Raman spectroscopy and X-ray diffraction — •Andreas Talkenberger1, Cameliu Himcinschi1, Kannan Vijayanandhini2, David Rafaja3, Ionela Vrejoiu2, Torsten Weißbach1, Christian Röder1, and Jens Kortus1 — 1TU Bergakademie Freiberg, Institute of Theoretical Physics, D-09596 Freiberg — 2Max Planck Institute of Microstructure Physics, Weinberg 2, D-06120 Halle — 3TU Bergakademie Freiberg, Institute of Materials Science, D-09596 Freiberg
BiCrO3 (BCO) is an interesting candidate for multiferroic applications. Therefore a deep understanding of the material properties and the fabrication of high quality epitaxial thin films is necessary. In this work we investigated epitaxially grown BCO thin films fabricated by pulsed laser deposition on SrTiO3, LSAT, NdGaO3 and DyScO3 by means of Raman spectroscopy and X-ray diffraction (XRD). The shift of phonon modes at room temperature indicates different strains in the BCO films grown on the different substrates. Primarily, the XRD experiments helped to quantify the elastic lattice strains caused by the lattice misfit between the substrate and the thin films. The reciprocal space mapping was employed to follow the relaxation of the lattice strain through the formation of microstructure defects. This data was correlated to the observed Raman shifts. Using density functional theory the shifts of the Raman peaks were calculated for different strain states, and compared to the experimentally observed ones. This work is supported by the German Research Foundation DFG HI 1534/1-1.