Berlin 2012 – scientific programme

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MI: Fachverband Mikrosonden

MI 2: TEM- and SEM-based material analysis

MI 2.3: Talk

Monday, March 26, 2012, 11:00–11:15, EMH 225

Characterization of thin-film solar cells by means of various scanning electron microscopy methods — •Daniel Abou-Ras — Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Hahn-Meitner-Platz 1, 14109 Berlin, Germany

This contribution gives an overview of the various analysis techniques available in scanning electron microscopy, applied to thin-film solar cells as important contribution for their optimization. Specifically, electron backscatter diffraction (EBSD) and energy-dispersive X-ray spectrometry (EDX) give information on microstructure and elemental distribution, while electron-beam-induced current (EBIC) and cathodoluminescence (CL) measurements provide access to electrical and optoelectronic properties. The combination of EBSD, EDX, EBIC, and CL on identical sample positions enhances the information content of the analysis results substantially. Various examples of such analyses will be given.