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DPG

Berlin 2012 – scientific programme

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MI: Fachverband Mikrosonden

MI 3: Scanning probe microscopy

Monday, March 26, 2012, 12:45–13:45, EMH 225

12:45 MI 3.1 Chemical nano-imaging of thin surface layers by combining AFM with tip-localized infrared spectroscopySergiu Amarie and •Fritz Keilmann
13:00 MI 3.2 New generation micro vacuum gauge for ultra high vacuum measurements using modified AFM tips — •Amra Avdic, Anna-Maria Lausch, Alois Lugstein, and Emmerich Bertagnolli
13:15 MI 3.3 All-Metal Cantilevers for Kelvin Force Microscopy — •Raul D. Rodriguez, Franziska Lüttich, Susanne Müller, Daniel Lehmann, and Dietrich R. T. Zahn
13:30 MI 3.4 Extracting intrinsic cantilever properties from thermal noise — •Jannis Lübbe, Matthias Temmen, Philipp Rahe, Angelika Kühnle, and Michael Reichling
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