Berlin 2012 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 86: Graphene VI
O 86.2: Vortrag
Freitag, 30. März 2012, 10:45–11:00, MA 041
Graphene studied with a multi-tip STM — •Stefan Korte, Vasily Cherepanov, and Bert Voigtländer — Peter Grünberg Institut (PGI-3), Forschungszentrum Jülich, 52425 Jülich, Germany, and JARA-Fundamentals of Future Information Technology
Graphene produced by exfoliation promises clean, defect free two-dimensional sheets. However, for conductance measurements, electrical contacts have to be created. This is usually done by lithography or other processing methods that might contaminate the graphene. With a multi tip STM unprocessed graphene flakes on SiO2 have been contacted for local four point measurements with flexible probe placement and geometry. Four point conductance measurements and potentiometry on graphene will be presented.