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DS: Fachverband Dünne Schichten
DS 27: Organic Thin Films II
DS 27.9: Talk
Wednesday, April 2, 2014, 17:15–17:30, CHE 91
Island size evolution and molecular diffusion during growth of organic thin films followed by time-resolved specular and off-specular scattering — Christian Frank1, Jiří Novák1, Rupak Banerjee1, •Alexander Gerlach1, Frank Schreiber1, Alexei Vorobiev2, and Stefan Kowarik3 — 1Institut für Angewandte Physik, Universität Tübingen, Germany — 2European Synchrotron Radiation Facility, Grenoble, France — 3Institut für Physik, Humboldt Universität Berlin, Germany
We report on a combined off-specular and specular X-ray scattering growth study of ultra-thin films of the prototypical organic semiconductor diindenoperylene (DIP, C32H16) [1,2]. We investigate the evolution of the in-plane correlation length and the growth kinetics of the films including their dependence on the substrate temperature and the growth rate. We observe a temperature dependent collective re-arrangement of DIP molecules from the thin-film to the bulk phase, which can be rationalized by incorporating a thickness-dependent out-of-plane lattice parameter. We further observe that the nucleation behavior of DIP changes from the 1st to the 2nd monolayer, which we relate to a difference in the diffusion of the molecules.
[1] S. Kowarik et al., Phys. Rev. Lett. 96 (2006) 125504
[2] A. Aufderheide et al., Phys. Rev. Lett. 109 (2012) 156102