Dresden 2014 – wissenschaftliches Programm
Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe
DS: Fachverband Dünne Schichten
DS 43: Poster II: Organic thin films; Atomic layer deposition, Thin film characterization: Structure analysis and composition (XRD, TEM, XPS, SIMS, RBS, ...)
DS 43.27: Poster
Donnerstag, 3. April 2014, 16:00–19:00, P1
Thickness dependency of the magnetic anisotropy of iron oxide on MgO(001) — •Tobias Schemme1, Nico Pathé1, Timo Kuschel2, and Joachim Wollschläger1 — 1Barbarastr. 7, 49076 Osnabrück — 2Universitätsstr. 25, 33615 Bielefeld
Iron oxide films with different thicknesses were prepared on MgO(001). The MgO substrates were cleaned by annealing at 400 ∘C in a 10−4 mbar oxygen atmosphere. Afterwards, the surface quality and cleanness was checked in-situ by low energy electron diffraction (LEED) and x-ray photoelectron spectroscopy (XPS), respectively. Iron oxide films with different thicknesses were grown using reactive molecular beam epitaxy (MBE) at 250 ∘C depositing Fe in a 10 −4 mbar oxygen atmosphere. Film thickness and the lattice constants were analyzed by x-ray reflectometry (XRR) and x-ray diffraction (XRD), respectively. These experiments reveal the singlecrystalline and epitactic state of the films. XPS spectra and LEED patterns indicate the stoichiometry and the surface structure of magnetite. Ex-situ magneto optic Kerr measurements were performed to investigate the magnetic properties. While the thinnest film shows a magnetic isotropic behavior, the thicker films exhibit a fourfold magnetic in-plane anisotropy. However, the anisotropy gets weaker with increasing film thickness.