Dresden 2014 – wissenschaftliches Programm
Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe
DS: Fachverband Dünne Schichten
DS 43: Poster II: Organic thin films; Atomic layer deposition, Thin film characterization: Structure analysis and composition (XRD, TEM, XPS, SIMS, RBS, ...)
DS 43.29: Poster
Donnerstag, 3. April 2014, 16:00–19:00, P1
High-resolution TEM investigation of an epitaxially strained LaNiO3/LaGaO3 superlattice — •Haoyuan Qi1, Michael Kinyanjui1, Eva Benckiser2, Hanns-ulrich Habermeier2, Bernhard Keimer2, and Ute Kaiser1 — 1University of Ulm, Central Facility of Electron Microscopy, Electron Microscopy Group of Materials Science, Albert Einstein Allee 11, D-89069 Ulm, Germany — 2Max Planck Institute for Solid State Research, Heisenbergstrasse 1, D-70579 Stuttgart, Germany
An epitaxially strained LaNiO3/LaGaO3 (LNO/LGO) superlattice grown on (001) SrTiO3 (STO) has been investigated. Due to the lattice mismatch, the superlattice is subject to tensile strain. The strain-induced distortions and deformations of the octahedral network may drastically influence the magnetic, electrical and structural functionalities of the heterostructures. We have studied the structural change, particularly the tilt system, of the octahedral network by means of aberration-corrected high-resolution transmission electron microscopy (AC-HRTEM). Each atomic column can be resolved clearly by applying negative Cs conditions. The two different octahedral tilt angles viewed in [110] projection indicate non-identical tilt systems in LNO and LGO layers. The atomic structure of the superlattice has been resolved, including in-plane and out-of-plane lattice parameters, distortions and rotation of the oxygen octahedral.