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MM: Fachverband Metall- und Materialphysik

MM 34: Poster Session

MM 34.14: Poster

Tuesday, April 1, 2014, 18:00–20:00, P4

Combined X-ray/Neutron reflectometer NREX - advanced tool for studying surfaces films and heterostructures — •Olaf Soltwedel, Yury Khaydukov, Thomas Keller, Franz Tralmer, Manfred Ohl, and Bernhard Keimer — MPI für Festkörperforschung, Heisenbergstraße 1, 70569, Stuttgart

This presentation will introduce neutron reflectometry, a unique tool to investigate properties of thin films like chemical composition, inter-diffusion, magnetic depth profiling etc. in buried films and dedicated sample environments on nanometre scale. Besides few theoretical aspects scientific applications ranging from polymer films at the solid/liquid interfaces over chemical depth profiling in amorphous hydrogenated carbon to magnetic thin films are presented. Finally, the realisation of a combined x-ray and neutron reflectometer will be shown in details. Here at the NREX reflectometer (FRM2, Garching, Germany) a conventional X-ray (Cu-Kα: λ = 1.541Å) add on offers the unique possibility to combine X-ray and neutron reflectometry in-situ.