Dresden 2014 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 54: Organic Electronics and Photovoltaics V (CPP jointly with DS, HL, O)
O 54.4: Vortrag
Mittwoch, 2. April 2014, 15:45–16:00, ZEU 260
Multi-analytical investigation of SAM formation on printing-relevant time scales II: infrared-reflection-absorption-spectroscopy — •Sabina Hillebrandt1,5, Janusz Schinke2,5, Milan Alt3,4,5, Robert Lovrincic2,5, Tobias Glaser1,5, and Annemarie Pucci1,5 — 1Universität Heidelberg, Kirchhoff-Institut für Physik — 2Technische Universität Braunschweig, Institut für Hochfrequenztechnik — 3Karlsruher Institut für Technologie — 4Merck KGaA, Darmstadt — 5Innovationlab GmbH, Heidelberg
In organic semiconductor devices the improvement of charge carrier injection between metal contact and organic semiconductor is a major concern. Self-assembled monolayers (SAMs) built up interface dipoles on metal surfaces that can increase or lower the work function of the material. Therefore SAMs can be used as injection layers. The properties of solution-processed SAMs such as orientation and interface dipole are influenced by various factors like concentration of the molecule in solution, immersion time and purity of the solution or substrate.
Infrared-reflection-absorption-spectroscopy (IRRAS) is very sensitive to changes in the orientation of SAMs on metal surfaces, thus we performed IRRAS measurements on SAMs consisting of 1H,1H,2H,2H-perfluorinated decanethiol on evaporated gold substrates. Orientation, ordering and quality of the SAM were investigated under systematic variation of immersion time and concentration of the molecule in solution. Taking into account realistic printing conditions we also investigated very short immersion times and high concentrations as well as the impact of oxygen in solvent and substrate on the layer formation.