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Dresden 2014 – scientific programme

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O: Fachverband Oberflächenphysik

O 63: Posters: Scanning Probe Methods

O 63.11: Poster

Wednesday, April 2, 2014, 17:30–21:00, P2

Construction of a multiscale and multitype scanning probe microscope — •Boris Groß, Hanna Fedderwitz, Hendrik Sträter, and Niklas Nilius — Carl-von-Ossietzky Universität, Oldenburg, Deutschland

Little is known about the optical and electronic phenomena that control the functionality of thin-film solar cells on a mesoscopic length scale ranging from tens of nm up to a few µ m. In fact, conventional techniques to characterize dielectric surfaces average over macroscopic sample areas and are therefore unsuitable to probe local effects. In contrast, SPM approaches capable of atomic resolution are still too complex and challenging to use them for a quick sample characterization. The gap between both techniques might still hold important information on the functionality of electronic and photovoltaic devices, in particular if not only morphological but also spectroscopic techniques are available for characterization. In this poster, we present the design for a versatile scanning probe microscope that combines the capabilities of AFM and STM with local photo-luminescence spectroscopy. The microscope’s key parameters are: Multi-scaling capabilities with image sizes from 10 nm to 500 µ m, various feedback modes to enable AFM and STM operation, use of different probe tips as nearfield sensor for local reflection and transmission studies and variable pressure and temperature ranges between 103 − 10−6 mbar and 77 − 300 K.

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