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Berlin 2015 – scientific programme

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CPP: Fachverband Chemische Physik und Polymerphysik

CPP 30: P2: Organic Electronics and Photovoltaics

CPP 30.13: Poster

Tuesday, March 17, 2015, 14:00–16:00, Poster B

Resonant GISAXS of conducting polymers — •Mihael Coric1, Nitin Saxena2, Jan Wernecke3, Stefanie Langner3, Peter Müller-Buschbaum2, Michael Krumrey3, and Eva M. Herzig11Technische Universität München, Munich School of Engineering, 85748 Garching, Germany — 2Technische Universität München, LS Funktionelle Materialien, 85748 Garching, Germany — 3Helmholtz-Zentrum Berlin BESSY, Physikalisch-Technische Bundesanstalt (PTB),Albert-Einstein-Straße 15, 12489 Berlin

In the last few years the use of X-ray for investigation of morphological structure of polymeric thin films in photovoltaic has increased. It is a suitable method to investigate morphological changes in the polymer film. So far mostly hard x-ray around 10 keV are used to probe the samples. The disadvantage of using hard x-rays when looking at polymers is that the scattering contrast is low and therefore they are difficult to distinguish from each other.

Another approach that is pursued in this work is choosing x-ray energies that are near absorption edges of certain elements. Using x-rays at absorption edges enables a much higher contrast between the different materials, increasing the distinguishability of the different components within the active film of the organic solar cell. In combination with grazing incident small angle scattering (GISAXS), the use of resonant x-rays at the absorption edge, offers a sophisticated way to investigate morphological changes of the polymer blend, making it a promising method for future use.

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