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Berlin 2015 – scientific programme

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DS: Fachverband Dünne Schichten

DS 37: Focussed Session: Oxide semiconductors II (joint session with HL)

DS 37.5: Talk

Thursday, March 19, 2015, 16:15–16:30, H 2032

Angle dependent Raman investigations of the different phases of SnxOy — •Christian T. Reindl, Martin Becker, Bruno K. Meyer, and Peter J. Klar — I. Physikalisches Institut, Justus-Liebig-Universität Giessen, Heinrich-Buff-Ring 16, 35392 Giessen, Germany

The two widely known tin oxide phases SnO2 and SnO are easily distinguished by examining their Raman spectra. Such Raman spectra contain information about the crystal structure and orientation as well as its quality, impurities, etc. Ion beam sputtered samples of SnO2 and SnO with well-defined orientations are investigated using rotational Raman spectroscopy, a technique where the sample is rotated in plane with respect to the incident laser polarization. The intensity of the scattered light is analyzed for different polarizations with respect to the incident light. The data obtained is used to confirm the assignments of Raman modes appearing in the spectra of SnO2 and SnO and to determine the values of the corresponding Raman tensor elements. Samples grown in the regime between the formation of these two phases yield completely different Raman spectra implies the formation of a third tin oxide phase in this intermediate regime. We present first identification of the Raman modes of this additional SnxOy phase. Furthermore, naturally grown crystals are investigated and compared to the samples grown by ion beam sputtering and chemical vapor deposition.

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