Parts | Days | Selection | Search | Updates | Downloads | Help

MI: Fachverband Mikrosonden

MI 7: X-ray Imaging, Tomography and X-ray Optics

MI 7.2: Talk

Wednesday, March 18, 2015, 09:45–10:00, EMH 225

Multi plane probe retrieval in X-ray nearfield imaging — •Johannes Hagemann¹, Anna-Lena Robisch¹, David Russell Luke², Carolin Homann², Thorsten Hohage², Peter Cloetens³, and Tim Salditt¹ — ¹Institute for X-Ray physics, G. A. U. Göttingen — ²Institute for Numerical and Applied Mathematics, G. A. U. Göttingen — ³European Synchrotron Radiation Facility

The probe, i.e. the impinging X-ray beam on the sample, is the main actor in X-ray imaging experiments when it comes to image quality. Knowledge about the probe helps to characterize the optics in use and to circumvent problems associated with the standard flat field correction. Additionally we can characterize beam properties as the degree of coherence or the size of the focal spot. We present reconstructions of the probes of different ESRF beamlines (ID16, ID19, ID22) which were used for X-ray imaging experiments. Gaining information about the probe is an example of the phase retrieval problem which is solved here by multiple detector plane positions [1]. This experimental scheme yields reconstructions without using an additional test sample.

[1] Hagemann, J. et al. Opt. Express 22, 11552 (2014)