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O: Fachverband Oberflächenphysik

O 37: Scanning Probe Techniques

O 37.9: Poster

Tuesday, March 17, 2015, 18:15–21:00, Poster A

Study of Nano Particle Friction Forces on Silicon using Atomic Force Microscopy — •Hannah Lauer, Daniel Geiger, Susanne Rappl, and Othmar Marti — Institute of Experimental Physics, Ulm University

For a variety of applications and industrial processes friction forces of nano particles on substrates are of prime importance. These forces are influenced by humidity, temperature and ageing phenomena of the contact zone. To investigate these parameters, a model system consisting of a planar surface and spherical particles with well known material properties like silicon was introduced. The interaction force between particle and surface was measured by means of atomic force microscopy (AFM).

A measurement procedure was developed that enables the controlled displacement and tracking of particles. Particles were moved in contact mode AFM. The force exerted by the tip is given by the torsion of the cantilever. However, this procedure is restricted to the measurement of one out of two in-plane force components. Therefore, the mean particle-surface interaction force has to be determined by statistical data analysis. The trajectory of the particles was monitored by imaging the sample in tapping mode before and after particle movement.

Experiments in progress with silica particles demonstrate the importance of adhesion. They also indicate that the rest time is an important parameter.