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Regensburg 2016 – scientific programme

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O: Fachverband Oberflächenphysik

O 42: Plasmonics and Nanooptics III: Infrared Microscopy

Tuesday, March 8, 2016, 14:00–16:00, H4

14:00 O 42.1 Determination of local variations in charge carrier concentrations of doped nanowires using infrared near-field microscopy — •Lena Jung, Robert Ukropec, Fabian Haas, Hilde Hardtdegen, Thomas Schäpers, and Thomas Taubner
14:15 O 42.2 Experimental investigation of the depth-dependent near-field coupling in subsurface s-SNOM imaging. — •Mike Prämassing, Martin Lewin, and Thomas Taubner
14:30 O 42.3 Amplitude-modulated scattering cross-section in near-field infrared microscopy (s-SNIM) — •Frederik Kuschewski, S.C. Kehr, N. Awari, B. Green, S. Kovalev, M. Gensch, and L.M. Eng
14:45 O 42.4 Exploring local-scale phase transitions by low-temperature scattering scanning near-field optical microscopy — •Jonathan Döring, Susanne C. Kehr, and Lukas M. Eng
15:00 O 42.5 Characterization of Thin Organic Layers using Synchrotron-based nano-FTIR Spectroscopy with adapted Storage Ring Optics — •Peter Hermann, Arne Hoehl, Bernd Kästner, C. Magnus Johnson, Piotr Patoka, Georg Ulrich, Jörg Feikes, Markus Ries, Tobias Götsch, Burkhard Beckhoff, Eckart Rühl, and Gerhard Ulm
15:15 O 42.6 Surface-enhanced infrared chemical imaging — •Frank Neubrech, Lucca Kühner, Mario Hentschel, Ute Zschieschang, Hagen Klauk, and Harald Giessen
15:30 O 42.7 Terahertz spectroscopy of individual donors in silicon by low temperature s-SNOM — •Denny Lang, Stephan Winnerl, Harald Schneider, Juerong Li, Steve Clowes, Ben Murdin, Jonathan Döring, Susanne C. Kehr, Lukas M. Eng, and Manfred Helm
15:45 O 42.8 Terahertz responses of a metal with sub-nm gap — •tae yun kim, sang jun park, dai-sik kim, and cheol-hwan park
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