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Dresden 2017 – scientific programme

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DS: Fachverband Dünne Schichten

DS 36: Postersession I

DS 36.9: Poster

Wednesday, March 22, 2017, 17:00–19:00, P2-EG

Spectroscopic Ellipsometry as a Method for Structural Investigation of Spinel Ferrite Thin Films — •Vitaly Zviagin1, Yogesh Kumar1, Paula Huth2, Israel Lorite1, Annette Setzer1, Daniel Spemann3, Karsten Fleischer4, Jan Meijer1, Reinhard Denecke2, Pablo Esquinazi1, Marius Grundmann1, and Rüdiger Schmidt-Grund11Universtät Leipzig, Institut für Experimentelle Physik II, Linnéstr. 5, Germany — 2Universtät Leipzig, Wilhelm-Ostwald-Institut für Physikalische und Theoretische Chemie, Linnéstr. 2, Germany — 3Leibniz-Institut für Oberflächenmodifizierung e. V., Permoserstr. 15, Germany — 4School of Physics, Trinity College Dublin, Dublin 2, Ireland

ZnFe2O4 and composite ZnxFe3−xO4 thin films were deposited at different conditions on SrTiO3 (100) and MgO (100) substrates by pulsed laser deposition. Features in the diagonal elements of the dielectric tensor, obtained by spectroscopic ellipsometry, hint to the presence of Fe2+ and Fe3+ cations located within the lattice by assignment of electronic transitions. While the increase of Fe2+ cation concentration on octahedral lattice sites corresponds to the increase in conductivity, measured by Hall effect, the increase of Fe3+ cation concentration on tetrahedral lattice sites corresponds to the increase in ferrimagnetic response of the spinel thin films, measured by SQUID.[1] In agreement with complimentary methods such as XPS and XAS, the presence of the mentioned cations corresponds to disorder and inversion of the lattice structure, also induced by annealing or irradiation with Si ions.
V. Zviagin et al., Appl. Phys. Lett. 108, 13 (2016)

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