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Dresden 2017 – scientific programme

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HL: Fachverband Halbleiterphysik

HL 86: New Materials

HL 86.7: Talk

Friday, March 24, 2017, 11:30–11:45, POT 112

Submicron scanning X-Ray diffraction imaging of strain in VO2 microwires. — •Andreas Johannes1, Jura Rensberg2, Carsten Ronning2, and Manfred Burghammer11ESRF - The European Synchrotron, 38043 Grenoble, France — 2Institut für Festkörperphysik, Friedrich-Schiller-Universität Jena, Max-Wien-Platz 1, 07743 Jena, Germany

X-Ray diffraction remains the go-to method to identify and characterize the crystal structure of a given material. In general, the small brilliance of lab sources means that large volumes of single crystalline or powdered material have to be investigated, averaging over all localized effects. At the increasing number of synchrotron based, focused X-Ray beam-lines, however, it is becoming possible to perform scanning experiments that yield specially resolved diffraction data. The advantages of this method are highlighted in the scientific case of imaging the strain and multiple-phase-coexistence in VO2 microwires.

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