Dresden 2017 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 63: Focus Session: Charge Transport at Surfaces and Nanostructures with Multi-probe Techniques
O 63.17: Poster
Dienstag, 21. März 2017, 18:30–20:30, P2-OG3
4-Point Nano Probing: Comparison of Single-Chip 4-Point Micro Probes as exposed to Multi Probe STM Heads — •T. Berghaus1, T. Richter1, and Y. Miyatake2 — 1nanoscore gmbh, Maisebachstr. 3, 61479 Glashütten, Germany — 2UNISOKU Co. Ltd., 2-4-3 Kasugano Hirakata, OSAKA 573-0131, Japan
STM-based nano probing has become of increasing interest as tool for characterising the properties of layered tructures, 2D materials like graphene, one-dimensional conductors, as well as for the investigation of topological insulators. Two fundamentally different instrumental implementations have evolved:(i) 2-Probe or 4-probe STMs using conventional macro-fabricated STM tips and having independent positioning, scan, and imaging means for each of the tips as proposed by Aono et al.[1]. (ii) STMs with single channel means for positioning, scan, and imaging, but using micro fabricated multi-tip chips - such as micro 4-point probe chips (micro 4PP)[2]. Here we compare the two approaches. The multi STM approach appears to be more flexible because of the independent tip positioning. On the other hand it is more expensive and difficult to control. Whereas the micro 4-PP approach offers many more possibilities for integration into demanding environments such as ultra low temperature or high magnetic fields as recently presented by Jian-Feng Ge et al. [3]. Further throughput and reproducibility can be enhanced by using commercially available micro-4PP chips [4].
[1] M.Aono et al.Oyo Buturi 67, 1361 (1998) [2] S. Hasegawa et al.Surf. Sci. 500, 84 (2002) [3] Jian-Feng Ge et al. Rev. Sci. Inst. 86, 053903 (2015). [4] Capres A/S, DK-2800 Kgs. Lyngby