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A: Fachverband Atomphysik

A 34: Atoms in Strong Fields I

A 34.4: Talk

Friday, March 10, 2017, 12:00–12:15, N 2

Single-shot characterization of few-cycle pulses based on stereographic above-threshold ionization at 1.8 µm — •Philipp Kellner¹, Daniel Adolph^1,2, Danilo Zille¹, Yinyu Zhang^1,2, Philipp Wustelt¹, Daniel Wuerzler¹, Max Moeller¹, A.M. Sayler^1,2, and G.G. Paulus^1,2 — ¹Institute of Optics and Quantum Electronics, Max-Wien-Platz 1, 07743 Jena, Germany — ²Helmholtz Institute Jena, Froebelstieg 3, 07743 Jena, Germany

The investigation of carrier-envelope (CE-)phase-dependent effects in strong-field laser-matter interaction calls for the precise measurement and control of the time-dependent electric field of few-cycle pulses. For 800 nm center wavelength, stereographic above-threshold ionization (stereo-ATI) in Xenon, i.e., the so-called carrier-envelope phasemeter (CE-phasemeter) is an established technique for a simultaneous, single-shot, real-time measurement of both the CEP and the pulse duration. Here we demonstrate single-shot CEP and pulse length characterisation at 1.8 µm with intense few-cycle pulses using stereo-ATI in Xenon and compare it to the results obtained at 800 nm. The demonstrated results open new opportunities in the investigation of CE-phase-dependent processes at shortwave infrared wavelengths.