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A: Fachverband Atomphysik

A 39: Clusters III (with MO)

A 39.5: Talk

Friday, March 10, 2017, 15:45–16:00, N 3

Photoelectron elastic scattering probed by angle resolved X-ray photoemission from free SiO₂ nanoparticles — •Burkhard Langer, Egill Antonsson, Ina Halfpap, Jaqueline Gottwald, and Eckart Rühl — Physikatische Chemie, Freie Universität Berlin

We report on measurements of the angular distributions of photoelectrons emitted from SiO₂ nanoparticles. A beam of free nanoparticles is crossed with a beam of X-rays from the BESSY II synchrotron facility. The studies were carried out over a wide energy range above the Si 2p and O 1s absorption edges, respectively. The photoelectron angular anisotropy is found to be lower for photoemission from SiO₂ nanoparticles than the theoretical values for isolated Si and O atoms. This can be explained by elastic scattering of the outgoing electrons at neighboring atoms. We will discuss a simple model that allows us to determine the number of elastic scattering events. In addition, a Monte Carlo calculation using literature values for scattering cross sections can be applied to quantitatively describe the measured angular distributions.