Berlin 2018 – wissenschaftliches Programm
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DS: Fachverband Dünne Schichten
DS 1: Layer Properties: Electronic, Optical and Mechanical
DS 1.7: Vortrag
Montag, 12. März 2018, 11:00–11:15, H 0111
Revealing Charge Redistribution at Hybrid Interfaces by DRS — •Tino Meisel1, Marcel Gawek1, Mino Sparenberg1, Sergey Sadofev1, Oliver Benson1, Emil J. W. List-Kratochvil1,2, and Sylke Blumstengel1,2 — 1Institute of Physics, Humboldt University Berlin — 2Institute of Chemistry, Humboldt University Berlin
Hybrid inorganic/organic systems (HIOS) combining functional conjugated molecules and inorganic semiconductors are promising candidates for opto-electronic devices such as photovoltaic cells and light emitting diodes. For these applications understanding of the interfacial electronic structure plays a key role. In this work we present differential reflectance spectroscopy (DRS) as a novel experimental tool to reveal ground state charge transfer at hybrid interfaces. As prototypical HIOS conjugated molecules (ladder-type quaterphenyl (L4P), NTCDA, F6TCNNQ) were deposited on top of epitaxial ZnO via molecular beam deposition and DRS was conducted in real time in the course of the organic layer growth. Two types of HIOS interfaces will be discussed: (i) HIOS with negligible interfacial charge transfer (L4P/ZnO). In this case the DR spectra can simply be modelled using the dielectric functions of the individual layers. (ii) HIOS with ground state charge transfer at the interface (F6TCNNQ/ZnO, NTCDA/ZnO). Here, the dielectric function of ZnO is significantly altered by the interaction with the molecules which causes a characteristic fingerprint in the DR spectra. DRS is thus viable tool to uncover interfacial charge carrier redistribution at HIOS interfaces.