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HL: Fachverband Halbleiterphysik

HL 17: Focussed Session: Atomic Scale Characterization

Tuesday, March 13, 2018, 09:30–13:00, EW 202

For a detailed understanding of complex semiconductor nano- and heterostructures as well as the physics of devices based on them, a systematic determination and correlation of the structural, chemical, electronic, and optical properties on a nanometer or atomic scale is essential. This session brings the atomic structural and chemical imaging using scanning tunneling microscopy, atomic probe tomography, and ultra-high resolution transmission electron microscopy together with the nanoscopic mapping of the optical and electronic properties using scanning transmission microscopy cathodoluminescence spectral imaging.

Organizers: Holger Eisele(TU Berlin), Frank Bertram and Jürgen Christen (OvGU Magdeburg)

09:30 HL 17.1 Invited Talk: Quantitative Electron Microscopy for III/V on Silicon integration — •Kerstin Volz
10:00 HL 17.2 Invited Talk: Total Tomography of Nonplanar Heterostructures: Doping and Confinement Pontentials — •Lincoln Lauhon
10:30 HL 17.3 Atomic Scale Investigation of Near Interface Defects at the SiC/SiO2-Interface: Microscopy, Atom Probe Tomography and Theory — •Dipanwita Dutta, Deb De, Elisabeth Müller, Stephan Gerstl, Stefan Goedecker, Holger Bartolf, Jörg Lehmann, Giovanni Alfieri, Massimo Camarda, Adolf Schöner, and Thomas Jung
10:45 HL 17.4 A three dimensional structural model of antiphase domains in GaP on Si(001) — •Pascal Farin, Malte Marquardt, Celina S. Schulze, Wjatscheslav Martyanov, Andreas Beyer, Kerstin Volz, and Andrea Lenz
11:00 HL 17.5 Structural and electronic properties of AlkInSe2/CuInSe2 (Alk = K, Rb, Cs) interfaces from density functional theory calculations — •Maria Malitckaya, Hannu-Pekka Komsa, Ville Havu, and Martti Puska
  11:15 15 min. break.
11:30 HL 17.6 Invited Talk: Modulating electron beams in space and time to probe for genuine structures and function at the atomic scale — •Christian Kisielowski
12:00 HL 17.7 Invited Talk: Advanced Nano-scale Characterization of Nitrides using Helium Temperature Scanning Transmission Electron Microscopy Cathodoluminescence — •Gordon Schmidt
12:30 HL 17.8 Invited Talk: Tip-enhanced Raman spectroscopy in semiconductor nanostructures and grapheneEmanuele Poliani and •Janina Maultzsch
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