Parts | Days | Selection | Search | Updates | Downloads | Help

MM: Fachverband Metall- und Materialphysik

MM 75: Topical Session (Symposium MM): Big Data in Materials Science - Managing and exploiting the raw material of the 21st century

MM 75.1: Topical Talk

Friday, March 16, 2018, 11:15–11:45, H 0107

Higher-dimensional synchrotron-based tomography for nanostructure characterization — •Manuel Guizar-Sicairos — Paul Scherrer Institut, Villigen PSI, Switzerland

High-energy X-rays can probe the nanostructure of a broad range of biological and synthetic materials, based on electron-density heterogeneity. Currently, the high photon flux employed to carry out synchrotron experiments has increased the acquisition speed in measurements and enabled multidimensional characterization of materials. Alongside from direct structure imaging via tomography, scanning small-angle X-ray scattering (sSAXS) can be used to gather statistical information about the local nanostructure, in the range from 1 to 100 nm, on macroscopic samples of a few millimeters in size. Thus, sSAXS is very well suited to study correlation between heterogeneous nanostructure and macroscopic sample characteristics.

After a brief introduction I will describe our efforts towards automatic classification and segmentation of the large volumes of data generated by sSAXS and some of its applications. Furthermore I will discuss the combination of sSAXS with computed tomography, a technique we term small-angle-scattering tensor tomography (SASTT), which allows probing 3D nanostructure anisotropy, within subvolumes (voxels) of a sample. Some emphasis will be given on the measurement and algorithms used for reconstruction of the 6D spatially-resolved reciprocal-space map.