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Berlin 2018 – scientific programme

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O: Fachverband Oberflächenphysik

O 97: Scanning probe techniques: Method development II

Thursday, March 15, 2018, 15:00–18:30, MA 005

15:00 O 97.1 Nanosecond time resolution in Electrostatic Force Microscopy — •Riccardo Borgani, Daniel Forchheimer, Per-Anders Thorén, and David B. Haviland
15:15 O 97.2 Two-degree-of-freedom control combining machine learning and extremum seeking for fast scanning quantum dot microscopy — •Michael Maiworm, Christian Wagner, Ruslan Temirov, F. Stefan Tautz, and Rolf Findeisen
15:30 O 97.3 Mapping Light-Induced Cantilever dynamics by Scanned Laser Radiation — •Sven Kraft, Dieter Schick, Semjon Köhnke, Boris Hage, Ingo Barke, and Sylvia Speller
15:45 O 97.4 Molecular model of a quantum dot junction beyond the constant interaction approximation — •Ruslan Temirov, Niklas Friedrich, Taner Esat, Philipp Leinen, Matthew F. B. Green, Christian Wagner, Pawel Chmielniak, Jeffrey Rawson, Paul Kögerler, Michael Rohlfing, and F. Stefan Tautz
16:00 O 97.5 Intermodulation gain and noise squeezing in dynamic AFM — •David Haviland, Alexander Revera-Ahlin, Daniel Forchheimer, Riccardo Borgani, Thomas Weissl, and Shan Jolin
  16:15 O 97.6 The contribution has been withdrawn.
  16:30 15 min. break
16:45 O 97.7 Low temperature scanning tunneling microscope with optical access — •Lars Wilmes, Kevin Edelmann, Moritz Winkler, Lukas Gerhard, and Wulf Wulfhekel
17:00 O 97.8 Evaluating the potential energy above a single molecule at room temperature with lateral force microscopy — •Alfred J. Weymouth, Elisabeth Riegel, Sonia Matencio, and Franz J. Giessibl
17:15 O 97.9 Unexpected lateral contrast in Topografiner imaging on sub-Angström corrugations — •Gabriele Bertolini, Robin Pröbsting, Danilo Andrea Zanin, Hugo Cabrera, Urs Ramsperger, Danilo Pescia, and Oguzhan Gürlü
17:30 O 97.10 Coherent single electron field emitter assembled with SPM — •Taner Esat, Niklas Friedrich, Ruslan Temirov, and F. Stefan Tautz
17:45 O 97.11 Investigation of the significance of higher harmonics in non-contact atomic force microscopy — •Daniel Heile, Alexander von Schmidsfeld, and Michael Reichling
18:00 O 97.12 Information content comparison of mulitfrequency afm methods — •Daniel Platz, Daniel Forchheimer, Erik Tholén, and David B. Haviland
18:15 O 97.13 Characterising NC-AFM cantilevers by opto-mechanical forces — •Alexander von Schmidsfeld and Michael Reichling
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